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Novel Photoconductive Decay Measurement System

Colorado School of Mines

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Technology Marketing SummaryThis invention provides a nondestructive, contactless means to measure the recombination of lifetime of a wide range of semiconducting and photoconducting materials. 
DescriptionThe device exceeds the performance and range of applicability of existing commercial products.  It utilizes a novel system of radio frequency coils that allow for rapid data acquisition time with no contact of the sensitive photovoltaic material.Benefits
  • Photovoltaic industry
  • Microelectronic industry
  • Optoelectronic industry
Applications and Industries
  • Fast data acquisition time.
  • Provides a non-destructive means of measuring the lifetime of a variety of materials
  • Performance exceeds those of current methods
  • Has a greater range of applicability than the current method
Technology Status
Technology IDDevelopment StageAvailabilityPublishedLast Updated
09001DevelopmentAvailable - We are seeking an exclusive or non-exclusive licensee for marketing, manufacturing, and sale of this technology. 10/06/201110/06/2011

Contact CSM About This Technology

To: William Vaughan<>