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Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings

United States Patent

*** EXPIRED ***
December 8, 1998
View the Complete Patent at the US Patent & Trademark Office
Idaho National Laboratory - Visit the Technology Transfer and Commercialization Office Website
A technique for determining properties such as Young's modulus, coefficient of thermal expansion, and residual stress of individual layers within a multi-layered sample is presented. The technique involves preparation of a series of samples, each including one additional layer relative to the preceding sample. By comparison of each sample to a preceding sample, properties of the topmost layer can be determined, and residual stress at any depth in each sample, resulting from deposition of the top layer, can be determined.
Finot; Marc (Somerville, MA), Kesler; Olivera (Cambridge, MA), Suresh; Subra (Wellesley, MA)
Massachusetts Institute of Technology (Cambridge, MA)
08/ 675,121
July 3, 1996
This invention was made with government support under Contract No. DE-AC07-941D13223 awarded by the U.S. Department of Energy and Grant No. N00014-94-1-0139 awarded by the Department of the Navy. The government has certain rights in the invention.