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Large angle solid state position sensitive x-ray detector system

United States Patent

*** EXPIRED ***
July 21, 1998
View the Complete Patent at the US Patent & Trademark Office
A method and apparatus for x-ray measurement of certain properties of a solid material. In distinction to known methods and apparatus, this invention employs a specific fiber-optic bundle configuration, termed a reorganizer, itself known for other uses, for coherently transmitting visible light originating from the scintillation of diffracted x-radiation from the solid material gathered along a substantially one dimensional linear arc, to a two-dimensional photo-sensor array. The two-dimensional photodetector array, with its many closely packed light sensitive pixels, is employed to process the information contained in the diffracted radiation and present the information in the form of a conventional x-ray diffraction spectrum. By this arrangement, the angular range of the combined detector faces may be increased without loss of angular resolution. Further, the prohibitively expensive coupling together of a large number of individual linear diode photodetectors, which would be required to process signals generated by the diffracted radiation, is avoided.
Kurtz; David S. (State College, PA), Ruud; Clay O. (State College, PA)
The Penn State Research Foundation (University Park, PA), Advanced Technology Materials, Inc. (Danbury, CT)
08/ 916,378
August 22, 1997
This invention was made with Government support under Contract No. DE-FG05-92ER81327 awarded by the U.S. Department of Energy. The Government has certain rights in this invention.