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Method and apparatus for calibrating a particle emissions monitor

United States Patent

*** EXPIRED ***
July 7, 1998
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
The instant invention discloses method and apparatus for calibrating particulate emissions monitors, in particular, and sampling probes, in general, without removing the instrument from the system being monitored. A source of one or more specific metals in aerosol (either solid or liquid) or vapor form is housed in the instrument. The calibration operation is initiated by moving a focusing lens, used to focus a light beam onto an analysis location and collect the output light response, from an operating position to a calibration position such that the focal point of the focusing lens is now within a calibration stream issuing from a calibration source. The output light response from the calibration stream can be compared to that derived from an analysis location in the operating position to more accurately monitor emissions within the emissions flow stream.
Flower; William L. (Livermore, CA), Renzi; Ronald F. (Tracy, CA)
Sandia Corporation (Livermore, CA)
08/ 585,341
January 11, 1996
STATEMENT OF GOVERNMENT INTEREST The government has rights in this invention pursuant to contract no. DE - AC04 - 94AL85000 between the U.S. Department of Energy and Sandia Corporation.