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Method for reduction of selected ion intensities in confined ion beams

United States Patent

*** EXPIRED ***
June 16, 1998
View the Complete Patent at the US Patent & Trademark Office
Pacific Northwest National Laboratory - Visit the Technology Commercialization Program Website
A method for producing an ion beam having an increased proportion of analyte ions compared to carrier gas ions is disclosed. Specifically, the method has the step of addition of a charge transfer gas to the carrier analyte combination that accepts charge from the carrier gas ions yet minimally accepts charge from the analyte ions thereby selectively neutralizing the carrier gas ions. Also disclosed is the method as employed in various analytical instruments including an inductively coupled plasma mass spectrometer.
Eiden; Gregory C. (Richland, WA), Barinaga; Charles J. (Richland, WA), Koppenaal; David W. (Richland, WA)
Battelle Memorial Institute (Richland, WA)
08/ 583,324
January 5, 1996
This invention was made with Government support under Contract DE-AC06-76RLO 1830 awarded by the U.S. Department of Energy. The Government has certain rights in the invention.