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Apparatus for imaging liquid and dielectric materials with scanning polarization force microscopy

United States Patent

*** EXPIRED ***
April 28, 1998
View the Complete Patent at the US Patent & Trademark Office
Lawrence Berkeley National Laboratory - Visit the Technology Transfer and Intellectual Property Management Department Website
The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability at low frequencies is from surface ions. The mobility of these ions depends strongly on the humidity. Using the inventive SFM, liquid films, droplets, and other weakly adsorbed materials have been imaged.
Hu; Jun (Berkeley, CA), Ogletree; D. Frank (El Cerrito, CA), Salmeron; Miguel (El Cerrito, CA), Xiao; Xudong (Kowloon, CN)
The Regents, University of California (Oakland, CA)
08/ 476,441
June 7, 1995
This invention was made with U.S. Government support under Contract No. DE-AC03-76SF00098 between the U.S. Department of Energy and the University of California for the operation of Lawrence Berkeley Laboratory. The U.S. Government may have certain rights in this invention.