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Full information acquisition in scanning probe microscopy and spectroscopy

United States Patent

April 4, 2017
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
Apparatus and methods are described for scanning probe microscopy and spectroscopy based on acquisition of full probe response. The full probe response contains valuable information about the probe-sample interaction that is lost in traditional scanning probe microscopy and spectroscopy methods. The full probe response is analyzed post data acquisition using fast Fourier transform and adaptive filtering, as well as multivariate analysis. The full response data is further compressed to retain only statistically significant components before being permanently stored.
Jesse; Stephen (Knoxville, TN), Belianinov; Alex (Oak Ridge, TN), Kalinin; Sergei V. (Knoxville, TN), Somnath; Suhas (Oak Ridge, TN)
UT-Battelle, LLC (Oak Ridge, TN)
15/ 063,144
March 7, 2016
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH This invention was made with United States government support under Contract No. DE-AC05-00OR22725 awarded by the United States Department of Energy. The United States government has certain rights in the invention.