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Strain mapping in TEM using precession electron diffraction

United States Patent

February 14, 2017
View the Complete Patent at the US Patent & Trademark Office
A sample material is scanned with a transmission electron microscope (TEM) over multiple steps having a predetermined size at a predetermined angle. Each scan at a predetermined step and angle is compared to a template, wherein the template is generated from parameters of the material and the scanning. The data is then analyzed using local mis-orientation mapping and/or Nye's tensor analysis to provide information about local strain states.
Taheri; Mitra Lenore (Philadelphia, PA), Leff; Asher Calvin (Philadelphia, PA)
Drexel University (Philadelphia, PA)
14/ 890,560
May 23, 2014
STATEMENT OF GOVERNMENT INTEREST This invention was made with government support under Contract Nos. DE-SC0008274 and DE-NE0000315 (Nuclear Energy University Program) awarded by the Department of Energy; and Contract No. CMMI-1150807 awarded by the National Science Foundation. The government has certain rights in the invention.