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Scanning measurement of Seebeck coefficient of a heated sample

United States Patent

April 19, 2016
View the Complete Patent at the US Patent & Trademark Office
A novel scanning Seebeck coefficient measurement technique is disclosed utilizing a cold scanning thermocouple probe tip on heated bulk and thin film samples. The system measures variations in the Seebeck coefficient within the samples. The apparatus may be used for two dimensional mapping of the Seebeck coefficient on the bulk and thin film samples. This technique can be utilized for detection of defective regions, as well as phase separations in the sub-mm range of various thermoelectric materials.
Snyder; G. Jeffrey (Pasadena, CA), Iwanaga; Shiho (Rancho Palos Verdes, CA)
California Institute of Technology (Pasadena, CA)
13/ 547,006
July 11, 2012
STATEMENT OF GOVERNMENT RIGHTS This invention was made with government support under DE-AR0000033 awarded by the Department of Energy. The government has certain rights in the invention.