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Detection of J-coupling using atomic magnetometer

United States Patent

September 22, 2015
View the Complete Patent at the US Patent & Trademark Office
Lawrence Berkeley National Laboratory - Visit the Technology Transfer and Intellectual Property Management Department Website
An embodiment of a method of detecting a J-coupling includes providing a polarized analyte adjacent to a vapor cell of an atomic magnetometer; and measuring one or more J-coupling parameters using the atomic magnetometer. According to an embodiment, measuring the one or more J-coupling parameters includes detecting a magnetic field created by the polarized analyte as the magnetic field evolves under a J-coupling interaction.
Ledbetter; Micah P. (Oakland, CA), Crawford; Charles W. (Albuquerque, NM), Wemmer; David E. (Berkeley, CA), Pines; Alexander (Berkeley, CA), Knappe; Svenja (Boulder, CO), Kitching; John (Boulder, CO), Budker; Dmitry (El Cerrito, CA)
The Regents of the University of California (Oakland, CA), The United States of America, as represented by the Secretary of Commerce, the National Institute of Standards and Technology (Washington, DC)
13/ 264,376
April 13, 2010
STATEMENT OF GOVERNMENT SUPPORT This invention was made with government support under Contract No. DE-AC02-05CH11231 awarded by the U.S. Department of Energy and with support from the National Institute of Standards and Technology, a non-regulatory agency within the U.S. Department of Commerce. The government has certain rights in this invention.