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Spatially resolved imaging of opto-electrical property variations

United States Patent

September 16, 2014
View the Complete Patent at the US Patent & Trademark Office
Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.
Nikiforov; Maxim (Chicago, IL), Darling; Seth B. (Chicago, IL), Suzer; Ozgun (Chicago, IL), Guest; Jeffrey (Northbrook, IL), Roelofs; Andreas (Wheaton, IL)
Uchicago Argonne, LLC (Chicago, IL)
13/ 629,320
September 27, 2012
STATEMENT OF GOVERNMENT INTEREST The United States Government has rights in the invention described herein pursuant to Contract No. DE-AC02-06CH11357 between the United States Department of Energy and UChicago Argonne, LLC, as operator of Argonne National Laboratory.