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System and methods to determine and monitor changes in microstructural properties

United States Patent

November 18, 2014
View the Complete Patent at the US Patent & Trademark Office
A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. An example system includes a number of ultrasonic transducers configured to transmit ultrasonic waves towards a target region on a specimen, a voltage source configured to excite the first and second ultrasonic transducers, and a processor configured to determine one or more properties of the specimen.
Turner; Joseph A. (Lincoln, NE)
Board of Regents of the University of Nebraska (Lincoln, NE)
12/ 984,291
January 4, 2011
This invention was made with government support under DRFR53-04-G00011 awarded by the Federal Railroad Administration and DE-FG02-01ER45890 awarded by the Department of Energy. The government has certain rights in the invention.