Skip to Content
Find More Like This
Return to Search

X-ray characterization of solid small molecule organic materials

United States Patent

June 10, 2014
View the Complete Patent at the US Patent & Trademark Office
Brookhaven National Laboratory - Visit the Office of Technology Commercialization and Partnerships Website
The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.
Billinge; Simon (Brooklyn, NY), Shankland; Kenneth (Reading, GB), Shankland; Norman (Glasgow, GB), Florence; Alastair (Glasgow, GB)
The Trustees of Columbia University in the City of New York (New York, NY)
12/ 802,064
May 28, 2010
GOVERNMENT FUNDING This invention was made with government support under DE-AC02-98CH10886 awarded by the U.S. Department of Energy. The government has certain rights in the invention.