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Multi-step contrast sensitivity gauge

United States Patent

October 14, 2014
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.
Quintana; Enrico C. (Albuquerque, NM), Thompson; Kyle R. (Albuquerque, NM), Moore; David G. (Albuquerque, NM), Heister; Jack D. (Albuquerque, NM), Poland; Richard W. (Aiken, SC), Ellegood; John P. (Aurora, CO), Hodges; George K. (Arab, AL), Prindville; James E. (Lincoln, CA)
Sandia Corporation (Albuquerque, NM)
13/ 241,569
September 23, 2011
STATEMENT OF GOVERNMENTAL INTEREST This invention was developed under contract DE-AC04-94AL85000 between Sandia Corporation and the U.S. Department of Energy. The U.S. Government has certain rights in this invention.