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System and methods to determine and monitor changes in microstructural properties

United States Patent

May 17, 2011
View the Complete Patent at the US Patent & Trademark Office
A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.
Turner; Joseph Alan (Lincoln, NE)
Board of Regents of the Universtiy of Nebraska (Lincoln, NE)
12/ 079,925
March 28, 2008
This invention was made with government support under DRFR53-04-G-00011 awarded by the Federal Railroad Administration and DE-FG02-01ER45890 awarded by the Department of Energy. The government has certain rights in the invention.