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NMR characterization of thin films

United States Patent

June 15, 2010
View the Complete Patent at the US Patent & Trademark Office
Argonne National Laboratory - Visit the Technology Development and Commercialization Website
A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.
Gerald, II; Rex E. (Brookfield, IL), Klingler; Robert J. (Glenview, IL), Rathke; Jerome W. (Homer Glen, IL), Diaz; Rocio (Chicago, IL), Vukovic; Lela (Westchester, IL)
The University of Chicago (Chicago, IL)
12/ 198,724
August 26, 2008
GOVERNMENT INTEREST The United States Government has certain rights in the invention pursuant to Contract No. W-31-109-ENG-38 between the U.S. Department of Energy and the University of Chicago operating Argonne National Laboratory.