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Electrochemical impedance spectroscopy system and methods for determining spatial locations of defects

United States Patent

August 8, 2006
View the Complete Patent at the US Patent & Trademark Office
Idaho National Laboratory - Visit the Technology Transfer and Commercialization Office Website
A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material.
Glenn; David F. (Idaho Falls, ID), Matthern; Gretchen E. (Idaho Falls, ID), Propp; W. Alan (Idaho Falls, ID), Glenn; Anne W. (Idaho Falls, ID), Shaw; Peter G. (Idaho Falls, ID)
Battelle Energy Alliance, LLC (Idaho Falls, ID)
11/ 015,427
December 16, 2004
GOVERNMENT RIGHTS The United States Government has rights in the following invention pursuant to Contract No. DE-AC07-991D13727 between the United States Department of Energy and Bechtel BWXT Idaho, LLC.