Skip to Content
Find More Like This
Return to Search

Mass spectrometer with electron source for reducing space charge effects in sample beam

United States Patent

October 14, 2003
View the Complete Patent at the US Patent & Trademark Office
Ames Laboratory - Visit the Iowa State University Research Foundation - Office of Intellectual Property & Technology Transfer Website
A mass spectrometer includes an ion source which generates a beam including positive ions, a sampling interface which extracts a portion of the beam from the ion source to form a sample beam that travels along a path and has an excess of positive ions over at least part of the path, thereby causing space charge effects to occur in the sample beam due to the excess of positive ions in the sample beam, an electron source which adds electrons to the sample beam to reduce space charge repulsion between the positive ions in the sample beam, thereby reducing the space charge effects in the sample beam and producing a sample beam having reduced space charge effects, and a mass analyzer which analyzes the sample beam having reduced space charge effects.
Houk; Robert S. (Ames, IA), Praphairaksit; Narong (Bangkok, TH)
Iowa State University Research Foundation, Inc. (Ames, IA)
09/ 758,391
January 12, 2001
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT Development of the present invention was federally funded under U.S. Department of Energy Contract No. W-7405-Eng-82.