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Condition assessment of nonlinear processes

United States Patent

November 19, 2002
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
There is presented a reliable technique for measuring condition change in nonlinear data such as brain waves. The nonlinear data is filtered and discretized into windowed data sets. The system dynamics within each data set is represented by a sequence of connected phase-space points, and for each data set a distribution function is derived. New metrics are introduced that evaluate the distance between distribution functions. The metrics are properly renormalized to provide robust and sensitive relative measures of condition change. As an example, these measures can be used on EEG data, to provide timely discrimination between normal, preseizure, seizure, and post-seizure states in epileptic patients. Apparatus utilizing hardware or software to perform the method and provide an indicative output is also disclosed.
Hively; Lee M. (Philadelphia, TN), Gailey; Paul C. (Athens, OH), Protopopescu; Vladimir A. (Knoxville, TN)
Lockheed Martin Energy Research Corporation (Oak Ridge, TN)
09/ 520,693
March 7, 2000
STATEMENT OF GOVERNMENT RIGHTS This invention was made with Government support under Contract No. DE-AC05-96OR22464 awarded by the U.S. Department of Energy to Lockheed Martin Energy Research Corporation, and the Government has certain rights in this invention.