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Laser detection of material thickness

United States Patent

September 3, 2002
View the Complete Patent at the US Patent & Trademark Office
Los Alamos National Laboratory - Visit the Technology Transfer Division Website
There is provided a method for measuring material thickness comprising: (a) contacting a surface of a material to be measured with a high intensity short duration laser pulse at a light wavelength which heats the area of contact with the material, thereby creating an acoustical pulse within the material: (b) timing the intervals between deflections in the contacted surface caused by the reverberation of acoustical pulses between the contacted surface and the opposite surface of the material: and (c) determining the thickness of the material by calculating the proportion of the thickness of the material to the measured time intervals between deflections of the contacted surface.
Early; James W. (Los Alamos, NM)
The Regents of the University of California (Los Alamos, NM)
09/ 379,889
August 23, 1999
This invention was made with government support under Contract No. W-7405-ENG-36 awarded by the U.S. Department of Energy. The government has certain rights in the invention.