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Relating to monitoring ion sources

United States Patent

April 2, 2002
View the Complete Patent at the US Patent & Trademark Office
Los Alamos National Laboratory - Visit the Technology Transfer Division Website
The apparatus and method provide techniques for monitoring the position on alpha contamination in or on items or locations. The technique is particularly applicable to pipes, conduits and other locations to which access is difficult. The technique uses indirect monitoring of alpha emissions by detecting ions generated by the alpha emissions. The medium containing the ions is moved in a controlled manner frog in proximity with the item or location to the detecting unit and the signals achieved over time are used to generate alpha source position information.
Orr; Christopher Henry (Calderbridge, GB), Luff; Craig Janson (Calderbridge, GB), Dockray; Thomas (Calderbridge, GB), Macarthur; Duncan Whittemore (Los Alamos, NM), Bounds; John Alan (Los Alamos, NM)
British Nuclear Fuels PLC (Cheshire, GB), The Regents of the University of California, The (Oakland, CA)
09/ 307,222
May 7, 1999
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT The U.S. Government has a paid-up license in this invention and the right in limited circumstances to require the patent owner to license others on reasonable terms as provided for by the terms of CRADA No. LA96C10298 and Contract No. W-7405-ENG-36 awarded by the U.S. Department of Energy.