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X-ray imaging crystal spectrometer for extended X-ray sources

United States Patent

July 10, 2001
View the Complete Patent at the US Patent & Trademark Office
Princeton Plasma Physics Laboratory - Visit the Office of Technology Transfer Website
Spherically or toroidally curved, double focusing crystals are used in a spectrometer for X-ray diagnostics of an extended X-ray source such as a hot plasma produced in a tokomak fusion experiment to provide spatially and temporally resolved data on plasma parameters using the imaging properties for Bragg angles near 45. For a Bragg angle of, the spherical crystal focuses a bundle of near parallel X-rays (the cross section of which is determined by the cross section of the crystal) from the plasma to a point on a detector, with parallel rays inclined to the main plain of diffraction focused to different points on the detector. Thus, it is possible to radially image the plasma X-ray emission in different wavelengths simultaneously with a single crystal.
Bitter; Manfred L. (Princeton, NJ), Fraenkel; Ben (Jerusalem, IL), Gorman; James L. (Bordentown, NJ), Hill; Kenneth W. (Lawrenceville, NJ), Roquemore; A. Lane (Cranbury, NJ), Stodiek; Wolfgang (Princeton, NJ), von Goeler; Schweickhard E. (Princeton, NJ)
The United States of America as represented by the United States Department of Energy (Washington, DC)
09/ 315,834
May 21, 1999
CONTRACTUAL ORIGIN OF THE INVENTION The United States Government has rights in this invention pursuant to Contract No. DE-AC02-76-CH03073 between the U.S. Department of Energy and Princeton University.