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Beam characterization by wavefront sensor

United States Patent

August 10, 1999
View the Complete Patent at the US Patent & Trademark Office
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An apparatus and method for characterizing an energy beam (such as a laser) with a two-dimensional wavefront sensor, such as a Shack-Hartmann lenslet array. The sensor measures wavefront slope and irradiance of the beam at a single point on the beam and calculates a space-beamwidth product. A detector array such as a charge coupled device camera is preferably employed.
Neal; Daniel R. (Tijeras, NM), Alford; W. J. (Albuquerque, NM), Gruetzner; James K. (Albuquerque, NM)
09/ 111,620
July 7, 1998
GOVERNMENT RIGHTS The Government has rights to this invention pursuant to Contract No. DE-AC04-94AL85000 awarded by the U.S. Department of Energy.