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System and methods to determine and monitor changes in microstructural properties

United States Patent Application

*** PATENT GRANTED ***
20090056454
7,942,058
A1
View the Complete Application at the US Patent & Trademark Office
The present invention is directed to a system and methods with changes in microstructure properties such as grain size, grain elongation, texture, and porosity, of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.
Turner, Joseph Alan (Lincoln, NE)
12/ 079,925
March 28, 2008
[0002] This invention was made with government support under DRFR53-04-G-00011 awarded by the Federal Railroad Administration and DE-FG02-01 ER45890 awarded by the Department of Energy. The government has certain rights in the invention.