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Methods and devices for measuring orbital angular momentum states of electrons

United States Patent Application

*** PATENT GRANTED ***
20170372866
9,960,008
A1
View the Complete Application at the US Patent & Trademark Office
A device for measuring electron orbital angular momentum states in an electron microscope includes the following components aligned sequentially in the following order along an electron beam axis: a phase unwrapper (U) that is a first electrostatic refractive optical element comprising an electrode and a conductive plate, where the electrode is aligned perpendicular to the conductive plate; a first electron lens system (L1); a phase corrector (C) that is a second electrostatic refractive optical element comprising an array of electrodes with alternating electrostatic bias; and a second electron lens system (L2). The phase unwrapper may be a needle electrode or knife edge electrode.
McMorran, Benjamin J. (Eugene, OR), Harvey, Tyler R. (Coupeville, WA)
15/ 632,131
June 23, 2017
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT [0002] This invention was made with Government support under contract DE-SC0010466 awarded by the Department of Energy. The Government has certain rights in the invention.