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Micromachine Artifact

Tag and Seal

Sandia National Laboratories

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PDF Document PublicationMarket Sheet (1,005 KB)

Technology Marketing SummaryWith counterfeit goods and company theft becoming a widespread problem, the importance of protecting valuable product is vital to the security of a company or country.  Sandia National Laboratories has created an anti-counterfeit unique identifying tag and seal that will prevent the possibility of counterfeit or the removal, replacement, or relocation of a product of object.DescriptionComplex silicon-based micromachine artifacts are embedded in a custom formulated clear acrylic polymer blend and UV cured.  The artifacts are placed upon a surface or joint to be marked or sealed. The pattern is recognized by a Sandia developed image analysis system that will establish a unique identifier that cannot be counterfeit. The tag includes a silicon frame with alignment marks intergral to it, surrounding and covered by the cured resin such that attempts to cut the seal in half by sophisticated methods will fail, since the silicon frame will break and not be repariable. BenefitsField applied anti-counterfeit mark and seal
Removal, replacement, relocation, and duplication tracking
Extremely high verification confidence
Suitable for mass production
Enables high volume, automated scanning
Applications and IndustriesAircraft and aerospace
Nuclear Power
Public Safety
International Safeguards
More InformationPatent Pending on SD# 11173Technology Status
Technology IDDevelopment StageAvailabilityPublishedLast Updated
SD# 11173Prototype - Sandia estimates this technology at approximately a Technology Readiness Level 4, due to key elements being demonstrated in laboratory environments. Available - Various licensing and partnering options are available. Please contact the IP department to discuss. 06/17/201103/12/2013

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