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Photon Induced Positron Annihilation (PIPA)

Idaho National Laboratory

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Technology Marketing Summary

This suite of patents define a non-destructive testing technology that uses photon induced positrons to measure volumetric changes in the lattice structure of metals, polymers, and ceramic components.  The system uses a linear accelerator or calibrated photon source, a germanium (Ge) detector and a data processing that can be operated by an easily-trained individual to provide results for further interpretation. The photon source is directed toward a target to create positrons within it, which are received a Ge detector positioned adjacent to the target being tested.  The detector produces raw data from this positron annihilation event, which are then captured by a data processing system. A rapid activation/analysis process includes a Doppler broadening algorithm that employs a broadening algorithm to process the raw data to present results indicating the presence or absence of a lattice defect in the material being tested.

Description

This suite of patents define a non-destructive testing technology that uses photon induced positrons to measure volumetric changes in the lattice structure of metals, polymers, and ceramic components.  The system uses a linear accelerator or calibrated photon source, a germanium (Ge) detector and a data processing that can be operated by an easily-trained individual to provide results for further interpretation. The photon source is directed toward a target to create positrons within it, which are received a Ge detector positioned adjacent to the target being tested.  The detector produces raw data from this positron annihilation event, which are then captured by a data processing system. A rapid activation/analysis process includes a Doppler broadening algorithm that employs a broadening algorithm to process the raw data to present results indicating the presence or absence of a lattice defect in the material being tested.

Benefits

This non-destructive testing technology uses positron annihilation to access manufacturing processes, the build up of damage in materials, and assesses remaining life at any point in a component’s life,  PIPA has the potential to assess current damage and remaining component life extending the component’s life beyond current forecasted life expectancies.

Applications and IndustriesManufacturing, Environmental inspections.Technology Status
Technology IDDevelopment StageAvailabilityPublishedLast Updated
PositronPrototypeAvailable04/27/201104/27/2011

Contact INL About This Technology

To: Gary Smith<Gary.Smith@inl.gov>