Skip to Content
Find More Like This
Return to Search

Compact mass spectrometer for plasma discharge ion analysis

United States Patent

*** EXPIRED ***
July 22, 1997
View the Complete Patent at the US Patent & Trademark Office
Los Alamos National Laboratory - Visit the Technology Transfer Division Website
A mass spectrometer and methods for mass spectrometry which are useful in characterizing a plasma. This mass spectrometer for determining type and quantity of ions present in a plasma is simple, compact, and inexpensive. It accomplishes mass analysis in a single step, rather than the usual two-step process comprised of ion extraction followed by mass filtering. Ions are captured by a measuring element placed in a plasma and accelerated by a known applied voltage. Captured ions are bent into near-circular orbits by a magnetic field such that they strike a collector, producing an electric current. Ion orbits vary with applied voltage and proton mass ratio of the ions, so that ion species may be identified. Current flow provides an indication of quantity of ions striking the collector.
Tuszewski; Michel G. (Los Alamos, NM)
The Regents of the University of California (Los Alamos, NM)
08/ 568,899
November 30, 1995
FIELD OF THE INVENTION This invention relates to the field of chemical analysis and, more particularly, to determination of mass and quantities of ions existing in a plasma by means of mass spectrometry. This invention was made with government support under Contract No. W-7405-ENG-36 awarded by the U.S. Department of Energy. The government has certain rights in the invention.