A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field.
GOVERNMENT RIGHTS
The United States Government has rights in this invention pursuant to Contract No. DE-ACO4-76DP00789 between the U.S. Department of Energy (DOE) and AT&T Technologies, Inc.