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Strain-optic voltage monitor wherein strain causes a change in the optical absorption of a crystalline material

United States Patent

*** EXPIRED ***
5,594,240
January 14, 1997
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
A voltage monitor which uses the shift in absorption edge of crystalline material to measure strain resulting from electric field-induced deformation of piezoelectric or electrostrictive material, providing a simple and accurate means for measuring voltage applied either by direct contact with the crystalline material or by subjecting the material to an electric field.
Weiss; Jonathan D. (Albuquerque, NM)
The United States of America as represented by the United States (Washington, DC)
08/ 407,148
March 20, 1995
GOVERNMENT RIGHTS The United States Government has rights in this invention pursuant to Contract No. DE-ACO4-76DP00789 between the U.S. Department of Energy (DOE) and AT&T Technologies, Inc.