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Contact-independent electrical conductance measurement

United States Patent

9,551,736
January 24, 2017
View the Complete Patent at the US Patent & Trademark Office
Electrical conductance measurement system including a one-dimensional semiconducting channel, with electrical conductance sensitive to electrostatic fluctuations, in a circuit for measuring channel electrical current. An electrically-conductive element is disposed at a location at which the element is capacitively coupled to the channel; a midpoint of the element aligned with about a midpoint of the channel, and connected to first and second electrically-conductive contact pads that are together in a circuit connected to apply a changing voltage across the element. The electrically-conductive contact pads are laterally spaced from the midpoint of the element by a distance of at least about three times a screening length of the element, given in SI units as (K.di-elect cons..sub.0/e.sup.2D(E.sub.F)).sup.1/2, where K is the static dielectric constant, .di-elect cons..sub.0 is the permittivity of free space, e is electron charge, and D(E.sub.F) is the density of states at the Fermi energy for the element.
Mentzel; Tamar S. (Fair Lawn, NJ), MacLean; Kenneth (Hingham, MA), Kastner; Marc A. (Newton, MA), Ray; Nirat (Natick, MA)
Massachusetts Institute of Technology (Cambridge, MA)
13/ 570,556
August 9, 2012
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH This invention was made with Government support under Contract No. DE-FG02-08ER46515, awarded by the Department of Energy; and under Contract No. W911NF-07-D-0004, awarded by the Army Research Office. The Government has certain rights in the invention.