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Beam imaging sensor and method for using same

United States Patent

9,535,100
January 3, 2017
View the Complete Patent at the US Patent & Trademark Office
The present invention relates generally to the field of sensors for beam imaging and, in particular, to a new and useful beam imaging sensor for use in determining, for example, the power density distribution of a beam including, but not limited to, an electron beam or an ion beam. In one embodiment, the beam imaging sensor of the present invention comprises, among other items, a circumferential slit that is either circular, elliptical or polygonal in nature. In another embodiment, the beam imaging sensor of the present invention comprises, among other things, a discontinuous partially circumferential slit. Also disclosed is a method for using the various beams sensor embodiments of the present invention.
McAninch; Michael D. (Goode, VA), Root; Jeffrey J. (Columbus, OH)
BWXT Nuclear Operations Group, Inc. (Lynchburg, VA)
14/ 595,593
20150129774
January 13, 2015
GOVERNMENT RIGHTS This invention was made with Government support Contract No. DE-AC11-07PN38361(A) awarded by the Department of Energy. The Government has certain rights in this invention.