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Probe tip heating assembly

United States Patent

9,476,816
October 25, 2016
View the Complete Patent at the US Patent & Trademark Office
A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.
Schmitz; Roger William (Hutchinson, MN), Oh; Yunje (Medina, MN)
Hysitron, Inc. (Eden Prairie, MN)
14/ 358,065
20140326707
November 14, 2012
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT This invention was made with Government support under (DE-FG02-07ER84812) awarded by the Department of Energy. The Government has certain rights in this invention.