Skip to Content
Find More Like This
Return to Search

Detection of electromagnetic radiation using nonlinear materials

United States Patent

June 14, 2016
View the Complete Patent at the US Patent & Trademark Office
An apparatus for detecting electromagnetic radiation within a target frequency range is provided. The apparatus includes a substrate and one or more resonator structures disposed on the substrate. The substrate can be a dielectric or semiconductor material. Each of the one or more resonator structures has at least one dimension that is less than the wavelength of target electromagnetic radiation within the target frequency range, and each of the resonator structures includes at least two conductive structures separated by a spacing. Charge carriers are induced in the substrate near the spacing when the resonator structures are exposed to the target electromagnetic radiation. A measure of the change in conductivity of the substrate due to the induced charge carriers provides an indication of the presence of the target electromagnetic radiation.
Hwang; Harold Y. (Cambridge, MA), Liu; Mengkun (Boston, MA), Averitt; Richard D. (Newton, MA), Nelson; Keith A. (Newton, MA), Sternbach; Aaron (Larchmont, NY), Fan; Kebin (Watertown, MA)
Massachusetts Institute of Technology (Cambridge, MA)
14/ 634,307
February 27, 2015
GOVERNMENT LICENSE RIGHTS This invention was made with government support under contract no. N00014-09-1-1103 awarded by the Office of Naval Research (ONR) and under Grant No. DE-SC0002384 awarded by the U.S. Department of Energy. The government has certain rights in the invention.