Skip to Content
Find More Like This
Return to Search

Imaging based refractometer for hyperspectral refractive index detection

United States Patent

November 24, 2015
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
Refractometers for simultaneously measuring refractive index of a sample over a range of wavelengths of light include dispersive and focusing optical systems. An optical beam including the range of wavelengths is spectrally spread along a first axis and focused along a second axis so as to be incident to an interface between the sample and a prism at a range of angles of incidence including a critical angle for at least one wavelength. An imaging detector is situated to receive the spectrally spread and focused light from the interface and form an image corresponding to angle of incidence as a function of wavelength. One or more critical angles are identified and corresponding refractive indices are determined.
Baba; Justin S. (Knoxville, TN), Boudreaux; Philip R. (Knoxville, TN)
UT-Battelle, LLC (Oak Ridge, TN)
13/ 768,802
February 15, 2013
ACKNOWLEDGMENT OF GOVERNMENT SUPPORT This invention was made with government support under Contract No. DE-AC05-00OR22725 awarded by the U.S. Department of Energy. The government has certain rights in the invention.