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Systems and methods for sample analysis

United States Patent

October 20, 2015
View the Complete Patent at the US Patent & Trademark Office
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
Cooks; Robert Graham (West Lafayette, IN), Li; Guangtao (Carmel, IN), Li; Xin (West Lafayette, IN), Ouyang; Zheng (West Lafayette, IN)
Purdue Research Foundation (West Lafayette, IN)
14/ 566,838
December 11, 2014
GOVERNMENT SUPPORT This invention was made with government support under CHE0848650 awarded by the National Science Foundation and DE-FG02-06ER15807 awarded by the Department of Energy. The government has certain rights in the invention.