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High-temperature strain cell for tomographic imaging

United States Patent

June 16, 2015
View the Complete Patent at the US Patent & Trademark Office
Lawrence Berkeley National Laboratory - Visit the Technology Transfer and Intellectual Property Management Department Website
This disclosure provides systems, methods, and apparatus related to the high temperature mechanical testing of materials. In one aspect, a method includes providing an apparatus. The apparatus may include a chamber. The chamber may comprise a top portion and a bottom portion, with the top portion and the bottom portion each joined to a window material. A first cooled fixture and a second cooled fixture may be mounted to the chamber and configured to hold the sample in the chamber. A plurality of heating lamps may be mounted to the chamber and positioned to heat the sample. The sample may be placed in the first and the second cooled fixtures. The sample may be heated to a specific temperature using the heating lamps. Radiation may be directed though the window material, the radiation thereafter interacting with the sample and exiting the chamber through the window material.
MacDowell; Alastair A. (Berkeley, CA), Nasiatka; James (San Francisco, CA), Haboub; Abdel (Richmond, CA), Ritchie; Robert O. (Berkeley, CA), Bale; Hrishikesh A. (Walnut Creek, CA)
The Regents of the University of California (Oakland, CA)
14/ 081,948
November 15, 2013
STATEMENT OF GOVERNMENT SUPPORT This invention was made with government support under Contract No. DE-AC02-05CH11231 awarded by the U.S. Department of Energy and under Contract No. FA9550-09-1-0477 awarded by the Air Force Office of Scientific Research. The government has certain rights in this invention.