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Systems and methods for sample analysis

United States Patent

8,932,875
January 13, 2015
View the Complete Patent at the US Patent & Trademark Office
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
Cooks; Robert Graham (West Lafayette, IN), Li; Guangtao (Carmel, IN), Li; Xin (West Lafayette, IN), Ouyang; Zheng (West Lafayette, IN)
Purdue Research Foundation (West Lafayette, IN)
13/ 977,758
20130344610
December 29, 2011
GOVERNMENT SUPPORT This invention was made with government support under CHE0848650 awarded by National Science Foundation and DE-FG02-06ER15807 awarded by Department of Energy. The government has certain rights in the invention.