Skip to Content
Find More Like This
Return to Search

Sparse sampling and reconstruction for electron and scanning probe microscope imaging

United States Patent

July 28, 2015
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
Systems and methods for conducting electron or scanning probe microscopy are provided herein. In a general embodiment, the systems and methods for conducting electron or scanning probe microscopy with an undersampled data set include: driving an electron beam or probe to scan across a sample and visit a subset of pixel locations of the sample that are randomly or pseudo-randomly designated; determining actual pixel locations on the sample that are visited by the electron beam or probe; and processing data collected by detectors from the visits of the electron beam or probe at the actual pixel locations and recovering a reconstructed image of the sample.
Anderson; Hyrum (Albuquerque, NM), Helms; Jovana (Dublin, CA), Wheeler; Jason W. (Albuquerque, NM), Larson; Kurt W. (Cedar Crest, NM), Rohrer; Brandon R. (Boston, MA)
Sandia Corporation (Albuquerque, NM)
14/ 482,754
September 10, 2014
STATEMENT OF GOVERNMENTAL INTEREST This invention was made with Government support under Contract No. DE-AC04-94AL85000 between Sandia Corporation and the U.S. Department of Energy. The Government has certain rights in the invention.