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X-ray backscatter imaging of nuclear materials

United States Patent

September 30, 2014
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
The energy of an X-ray beam and critical depth are selected to detect structural discontinuities in a material having an atomic number Z of 57 or greater. The critical depth is selected by adjusting the geometry of a collimator that blocks backscattered radiation so that backscattered X-ray originating from a depth less than the critical depth is not detected. Structures of Lanthanides and Actinides, including nuclear fuel rod materials, can be inspected for structural discontinuities such as gaps, cracks, and chipping employing the backscattered X-ray.
Chapman; Jeffrey Allen (Knoxville, TN), Gunning; John E. (Oak Ridge, TN), Hollenbach; Daniel F. (Oak Ridge, TN), Ott; Larry J. (Knoxville, TN), Shedlock; Daniel (Knoxville, TN)
UT-Battelle, LLC (Oak Ridge, TN)
13/ 288,168
November 3, 2011
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT This disclosure was made with government support under a research project supported by under Contract No. DE-ACO5-000R22725 awarded by the U.S. Department of Energy. The government has certain rights in this disclosure.