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Apparatus and method for determining microscale interactions based on compressive sensors such as crystal structures

United States Patent

April 21, 2015
View the Complete Patent at the US Patent & Trademark Office
Techniques for determining values for a metric of microscale interactions include determining a mesoscale metric for a plurality of mesoscale interaction types, wherein a value of the mesoscale metric for each mesoscale interaction type is based on a corresponding function of values of the microscale metric for the plurality of the microscale interaction types. A plurality of observations that indicate the values of the mesoscale metric are determined for the plurality of mesoscale interaction types. Values of the microscale metric are determined for the plurality of microscale interaction types based on the plurality of observations and the corresponding functions and compressed sensing.
McAdams; Harley (Stanford, CA), AlQuraishi; Mohammed (Stanford, CA)
The Board of Trustees of the Leland Stanford Jr. University (Palo Alto, CA)
13/ 426,824
March 22, 2012
STATEMENT OF GOVERNMENTAL INTEREST This invention was made with Government support under Grant No. DE-FG02-05ER64136 awarded by the Office of Science of the Department of the Energy. The Government has certain rights in the invention.