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Apparatus and procedure to characterize the surface quality of conductors by measuring the rate of cathode emission as a function of surface electric field strength

United States Patent

October 21, 2014
View the Complete Patent at the US Patent & Trademark Office
Thomas Jefferson National Accelerator Facility - Visit the Technology Review Committee Website
A device and method for characterizing quality of a conducting surface. The device including a gaseous ionizing chamber having centrally located inside the chamber a conducting sample to be tested to which a negative potential is applied, a plurality of anode or "sense" wires spaced regularly about the central test wire, a plurality of "field wires" at a negative potential are spaced regularly around the sense, and a plurality of "guard wires" at a positive potential are spaced regularly around the field wires in the chamber. The method utilizing the device to measure emission currents from the conductor.
Mestayer; Mac (Williamsburg, VA), Christo; Steve (Gloucester, VA), Taylor; Mark (Hampton, VA)
Jefferson Science Associates, LLC (Newport News, VA)
13/ 374,752
January 11, 2012
The United States government may have certain rights to this invention under Management and Operating Contract No. DE-AC05-06OR23177 from the Department of Energy.