Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
STATEMENT OF GOVERNMENT LICENSE RIGHTS
This invention was made with Government support under contract DE-SC0001084 awarded by the Department of Energy and under contract DMR 0449422 awarded by the National Science Foundation. The Government has certain rights in the invention.