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Sub-microsecond-resolution probe microscopy

United States Patent

April 1, 2014
View the Complete Patent at the US Patent & Trademark Office
Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
Ginger; David (Seattle, WA), Giridharagopal; Rajiv (Seattle, WA), Moore; David (Seattle, WA), Rayermann; Glennis (Seattle, WA), Reid; Obadiah (Denver, CO)
University of Washington through its Center for Commercialization (Seattle, WA)
13/ 232,859
September 14, 2011
STATEMENT OF GOVERNMENT LICENSE RIGHTS This invention was made with Government support under contract DE-SC0001084 awarded by the Department of Energy and under contract DMR 0449422 awarded by the National Science Foundation. The Government has certain rights in the invention.