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Method for using polarization gating to measure a scattering sample

United States Patent

August 4, 2015
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
Described herein are systems, devices, and methods facilitating optical characterization of scattering samples. A polarized optical beam can be directed to pass through a sample to be tested. The optical beam exiting the sample can then be analyzed to determine its degree of polarization, from which other properties of the sample can be determined. In some cases, an apparatus can include a source of an optical beam, an input polarizer, a sample, an output polarizer, and a photodetector. In some cases, a signal from a photodetector can be processed through attenuation, variable offset, and variable gain.
Baba; Justin S. (Knoxville, TN)
UT-Battelle, LLC (Oak Ridge, TN)
13/ 962,826
August 8, 2013
ACKNOWLEDGMENT OF GOVERNMENT SUPPORT This invention was made with government support under Contract No. DE-AC05-000R22725 awarded by the U.S. Department of Energy. The government has certain rights in the invention.