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Transistor-based particle detection systems and methods

United States Patent

June 9, 2015
View the Complete Patent at the US Patent & Trademark Office
Transistor-based particle detection systems and methods may be configured to detect charged and non-charged particles. Such systems may include a supporting structure contacting a gate of a transistor and separating the gate from a dielectric of the transistor, and the transistor may have a near pull-in bias and a sub-threshold region bias to facilitate particle detection. The transistor may be configured to change current flow through the transistor in response to a change in stiffness of the gate caused by securing of a particle to the gate, and the transistor-based particle detection system may configured to detect the non-charged particle at least from the change in current flow.
Jain; Ankit (West Lafayette, IN), Nair; Pradeep R. (Mumbai, IN), Alam; Muhammad Ashraful (West Lafayette, IN)
Purdue Research Foundation (West Lafayette, IN)
13/ 748,171
January 23, 2013
STATEMENT OF GOVERNMENT INTEREST This invention was made with government support under Grant No. DE-FC52-08NA28617 awarded by the U.S. Department of Energy. The government has certain rights in the invention.