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Optically stimulated differential impedance spectroscopy

United States Patent

February 18, 2014
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
Methods and apparatuses for evaluating a material are described. Embodiments typically involve use of an impedance measurement sensor to measure the impedance of a sample of the material under at least two different states of illumination. The states of illumination may include (a) substantially no optical stimulation, (b) substantial optical stimulation, (c) optical stimulation at a first wavelength of light, (d) optical stimulation at a second wavelength of light, (e) a first level of light intensity, and (f) a second level of light intensity. Typically a difference in impedance between the impedance of the sample at the two states of illumination is measured to determine a characteristic of the material.
Maxey; Lonnie C. (Powell, TN), Parks, II; James E. (Knoxvile, TN), Lewis, Sr.; Samuel A. (Powell, TN), Partridge, Jr.; William P (Oak Ridge, TN)
UT-Battelle, LLC (Oak Ridge, TN)
12/ 326,223
December 2, 2008
GOVERNMENT RIGHTS This invention was made with government support under Contract No. DE-AC05-00OR22725 awarded by the U.S. Department of Energy. The government has certain rights in the invention.