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Positron emission imaging device and method of using the same

United States Patent

January 15, 2013
View the Complete Patent at the US Patent & Trademark Office
Oak Ridge National Laboratory - Visit the Partnerships Directorate Website
An imaging system and method of imaging are disclosed. The imaging system can include an external radiation source producing pairs of substantially simultaneous radiation emissions of a picturization emission and a verification emissions at an emission angle. The imaging system can also include a plurality of picturization sensors and at least one verification sensor for detecting the picturization and verification emissions, respectively. The imaging system also includes an object stage is arranged such that a picturization emission can pass through an object supported on said object stage before being detected by one of said plurality of picturization sensors. A coincidence system and a reconstruction system can also be included. The coincidence can receive information from the picturization and verification sensors and determine whether a detected picturization emission is direct radiation or scattered radiation. The reconstruction system can produce a multi-dimensional representation of an object imaged with the imaging system.
Bingham; Philip R. (Knoxville, TN), Mullens; James Allen (Farragut, TN)
UT-Battelle, LLC (Oak Ridge, TN)
12/ 827,402
June 30, 2010
STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT The United States Government has rights in this invention pursuant to Contract No. DE-AC05-00OR22725 between the United States Department of Energy and UT-Battelle, LLC.