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Method of multi-dimensional moment analysis for the characterization of signal peaks

United States Patent

8,296,078
October 23, 2012
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
A method of multi-dimensional moment analysis for the characterization of signal peaks can be used to optimize the operation of an analytical system. With a two-dimensional Peclet analysis, the quality and signal fidelity of peaks in a two-dimensional experimental space can be analyzed and scored. This method is particularly useful in determining optimum operational parameters for an analytical system which requires the automated analysis of large numbers of analyte data peaks. For example, the method can be used to optimize analytical systems including an ion mobility spectrometer that uses a temperature stepped desorption technique for the detection of explosive mixtures.
Pfeifer; Kent B. (Los Lunas, NM), Yelton; William G. (Sandia Park, NM), Kerr; Dayle R. (Sandia Park, NM), Bouchier; Francis A. (Albuquerque, NM)
Sandia Corporation (Albuquerque, NM)
12/ 491,733
June 25, 2009
STATEMENT OF GOVERNMENT INTEREST This invention was made with Government support under contract no. DE-AC04-94AL85000 awarded by the U.S. Department of Energy to Sandia Corporation. The Government has certain rights in the invention.