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Structure function monitor

United States Patent

January 24, 2012
View the Complete Patent at the US Patent & Trademark Office
Sandia National Laboratories - Visit the Intellectual Property Management and Licensing Website
Methods and apparatus for a structure function monitor provide for generation of parameters characterizing a refractive medium. In an embodiment, a structure function monitor acquires images of a pupil plane and an image plane and, from these images, retrieves the phase over an aperture, unwraps the retrieved phase, and analyzes the unwrapped retrieved phase. In an embodiment, analysis yields atmospheric parameters measured at spatial scales from zero to the diameter of a telescope used to collect light from a source.
McGraw; John T. (Placitas, NM), Zimmer; Peter C. (Albuquerque, NM), Ackermann; Mark R. (Albuquerque, NM)
STC.UNM (Albuquerque, NM)
11/ 325,635
January 4, 2006
GOVERNMENT INTEREST STATEMENT This invention was made with Government support under Contract DE-AC04-94AL85000 awarded by the United States Department of Energy. The Government has certain rights in the invention.