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Carbon nanotube oscillator surface profiling device and method of use

United States Patent

November 15, 2011
View the Complete Patent at the US Patent & Trademark Office
The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure changes in the characteristics of the motion of the carbon nanotube oscillating near a sample surface, and profile the roughness of this surface. The device operates in a non-contact mode, thus it can be virtually non-wear and non-fatigued system. It is an alternative to the existing atomic force microscope (AFM) tips used to scan surfaces to determine their roughness.
Popescu; Adrian (Tampa, FL), Woods; Lilia M. (Tampa, FL), Bondarev; Igor V. (Fuquay Varina, NC)
University of South Florida (Tampa, FL), North Carolina Central University (Durham, NC)
12/ 548,070
August 26, 2009
STATEMENT OF GOVERNMENT INTEREST This invention was made with government support under U.S. Department of Energy grant DE-FG02-06ER46297, and the government thus may have certain rights in this invention.