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Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

United States Patent

October 18, 2011
View the Complete Patent at the US Patent & Trademark Office
Savannah River National Laboratory - Visit the Technology Transfer Website
An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.
Fink; Samuel D. (Aiken, SC), Fondeur; Fernando F. (North Augusta, SC)
Savannah River Nuclear Solutions, LLC (Aiken, SC)
12/ 082,572
April 12, 2008
STATEMENT AS TO RIGHTS TO INVENTIONS MADE UNDER FEDERALLY SPONSORED RESEARCH AND DEVELOPMENT This invention was made with Government support under Contract No. DE-AC09-96-SR18500 awarded by the United States Department of Energy. The Government has certain rights in the invention.